Soft X-ray characterization technique for Li batteries under operating conditions

Optimum driving a Z-pinch for soft X-Ray lasers

A capillary plasma z-pinch as an alternative active medium of soft X-Ray lasers was studied experimentally and theoretically. The theoretical analysis was based on the self consistent solution of the so called “snow plow” model. The dynamics of pinched plasma is determined by the capillary parameters and by the time dependence of electrical current passing through it. The current time dependenc...

In-situ X-ray nano-CT System for Polymer Electrolyte Fuel Cells under Operating Conditions

We developed two types of in-situ three-dimensional imaging systems on the basis of full-field transmission X-ray computed tomography (XCT) methods for polymer electrolyte fuel cells (PEFCs) under operating conditions at beamline BL36XU at SPring-8. One was for a wide field of view (more than 500 μm) to obtain the whole membrane electrode assembly (MEA) images, and the other was for nano spatia...

Soft x-ray free electron laser microfocus for exploring matter under extreme conditions.

We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 microJ, 5 Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(m...

X-ray Absorption Spectroscopy Characterization of a Li/S Cell

The X-ray absorption spectroscopy technique has been applied to study different stages of the lithium/sulfur (Li/S) cell life cycle. We have investigated how speciation of S in Li/S cathodes changes upon the introduction of CTAB (cetyltrimethylammonium bromide, CH₃(CH₂)15N⁺(CH₃)₃Br-) and with charge/discharge cycling. The introduction of CTAB changes the synthesis reaction pathway dramatically ...

Spontaneous soft x-ray fluorescence from a superlattice under Kossel diffraction conditions